The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Jan. 25, 2010
King Jen Chang, Taipei, TW;
Wen Hwa Chen, Taipei, TW;
Argon Chen, Zhonghe, TW;
Chiung Nein Chen, Jiali Township, Tainan County, TW;
Ming Chih Ho, Taipei, TW;
Hao Chih Tai, Taipei, TW;
Ming Hsun Wu, Taipei, TW;
Hsin-jung Wu, Taiping, TW;
King Jen Chang, Taipei, TW;
Wen Hwa Chen, Taipei, TW;
Argon Chen, Zhonghe, TW;
Chiung Nein Chen, Jiali Township, Tainan County, TW;
Ming Chih Ho, Taipei, TW;
Hao Chih Tai, Taipei, TW;
Ming Hsun Wu, Taipei, TW;
Hsin-Jung Wu, Taiping, TW;
AmCad BioMed Corporation, Taipei, TW;
Abstract
The present invention relates to a method for multi-layer classifier applying on a computer readable medium for classifying multiple image samples. The method at least comprising the following steps: (a) receiving a plurality of samples; (b) providing a plurality of attributes, and evaluating a significance of the attributes by a selection criterion; (c) selecting at least one cut-point to establish a discriminant analysis model; (d) proceeding a step of evaluating a performance of the discriminant analysis model by adding the attributes to the discriminant analysis model; and (e) providing a stop criterion. The present invention also provides a computer readable medium for classifying multiple image samples by using the method for multi-layer classifier.