The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Dec. 29, 2009
Moises Cases, Austin, TX (US);
Jinwoo Choi, Austin, TX (US);
Bhyrav M. Mutnury, Austin, TX (US);
Navraj Singh, Stanford, CA (US);
Moises Cases, Austin, TX (US);
Jinwoo Choi, Austin, TX (US);
Bhyrav M. Mutnury, Austin, TX (US);
Navraj Singh, Stanford, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A statistical approach can be used to efficiently supply an initial population that provides a good global description of a design space. The SI based simulation can then find a global best design within a reduced number of simulations. The statistical approach can be utilized to determine a plurality of potential best and worst case designs from a design space. The plurality of potential best and worst case designs from the design space seed or prime a SI based simulation. The best case designs are based on design parameters than can be controlled. The worst case designs are based on design parameters than cannot be controlled due. SI based simulations can then be run on the best case designs with respect to the worst case designs to determine probability of failure of the best case design.