The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Dec. 01, 2011
Applicants:
Stephen Glanowski, Great Falls, VA (US);
Jeremy Heil, Derwood, MD (US);
Emily S. Winn-deen, Potomac, MD (US);
Ivy A. Mcmullen, Towson, MD (US);
Inventors:
Stephen Glanowski, Great Falls, VA (US);
Jeremy Heil, Derwood, MD (US);
Emily S. Winn-Deen, Potomac, MD (US);
Ivy A. McMullen, Towson, MD (US);
Assignee:
Applied Biosystems, LLC, Carlsbad, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides methods and systems for an automated method of identifying allele values from data files derived from processed fluorophore emissions detected during the observation of fluorophore labeled nucleotide probes used in analyzing polymorphic DNA are provided. These methods are used in the rapid and efficient distinguishing of targeted polymorphic DNA sites without control samples.