The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Aug. 11, 2009
Terrence Lynn Blevins, Round Rock, TX (US);
Wilhelm K. Wojsznis, Austin, TX (US);
Mark Nixon, Round Rock, TX (US);
Paul Richard Muston, Narborough, GB;
Christopher Worek, Austin, TX (US);
Randolf Reiss, Dripping Springs, TX (US);
Terrence Lynn Blevins, Round Rock, TX (US);
Wilhelm K. Wojsznis, Austin, TX (US);
Mark Nixon, Round Rock, TX (US);
Paul Richard Muston, Narborough, GB;
Christopher Worek, Austin, TX (US);
Randolf Reiss, Dripping Springs, TX (US);
Fisher-Rosemount Systems, Inc., Round Rock, TX (US);
Abstract
Example methods and apparatus to predict process quality in a process control system are disclosed. A disclosed example method includes receiving process control information relating to a process at a first time including a first value associated with a first measured variable and a second value associated with a second measured variable, determining if a variation based on the received process control information associated with the process exceeds a threshold, if the variation exceeds the threshold, calculating a first contribution value based on a contribution of the first measured variable to the variation and a second contribution value based on a contribution of the second measured variable to the variation, determining at least one corrective action based on the first contribution value, the second contribution value, the first value, or the second value, and calculating a predicted process quality based on the at least one corrective action at a time after the first time.