The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Dec. 18, 2009
Hongjie Yao, Shenzhen, CN;
Hongjie Yao, Shenzhen, CN;
Huawei Device Co., Ltd., Shenzhen, CN;
Abstract
An image quality evaluation device is disclosed in the present invention, including: an image analyzer, adapted to analyze the parameters of an image to obtain parameter values; and an evaluation unit, adapted to evaluate the quality of an image based on parameter values in line with the predetermined standard and generate the evaluation result. An image quality evaluation method is disclosed in the present invention, including: analyze the parameters of an image to obtain parameter values; and evaluate the quality of an image based on parameter values in line with the predetermined standard and generate the evaluation result. An image quality evaluation device and method provided in the present invention are used to analyze the parameters of an image with the image recognition technology to obtain parameter values and then generate the parameter values in line with the predetermined standard. In this way, the photo quality can be evaluated automatically in the present invention to decrease the exhausted manpower and improve the entertainment function.