The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Dec. 04, 2009
Oleg Tischenko, München, DE;
Yuan Xu, Eugene, OR (US);
Christoph Hoeschen, Hebertshausen, DE;
Abstract
A method of reconstructing a tomographic image of a region of investigation with reduced artifacts, said method comprises the steps of (a) reconstructing a first partial image and a second partial image of the region of investigation from first and second projection profiles each of which including projection data collected at first and second different groups of parallel projection lines, resp., wherein the first and second projection profiles are provided such that streak aliasing artifacts in the first and second partial images have different spatial phases, and (b) generating the tomographic image of the region of investigation by superimposing the first and second partial images. Preferably, the first and second projection profiles are constructed such that streak aliasing artifacts in the first and second partial images have opposite spatial phases relative to each other. Furthermore, an imaging method and an imaging device for imaging a region of investigation in an object are described.