The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Dec. 27, 2010
Applicant:
Kaoru Hama, Kanagawa, JP;
Inventor:
Kaoru Hama, Kanagawa, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
According to the embodiments, a read circuit is connected to the other end of the bit line for reading out data from read data storing memory cells and test data storing memory cells via the bit line, and a read control circuit makes data to be read out from the test data storing memory cells when testing the bit line and makes data to be read out from the read data storing memory cells when reading out the read data.
Hama, Kaoru. (2013). Semiconductor memory and semiconductor memory test method (U.S. Patent No. 8570822). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8570822
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