The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2013

Filed:

Sep. 20, 2011
Applicants:

Yutaka Takakubo, Saitama, JP;

Eijiroh Tada, Saitama, JP;

Koichi Maruyama, Tokyo, JP;

Inventors:

Yutaka Takakubo, Saitama, JP;

Eijiroh Tada, Saitama, JP;

Koichi Maruyama, Tokyo, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging optical system, which includes an imaging lens group having at least one lens, and an image side prism that bends light which has passed through the imaging lens group toward an image pickup device arranged at a predetermined position, and wherein the image side prism includes a reflection surface which reflects, toward the image pickup device, incident light proceeding from the imaging lens group and an exit surface from which light reflected from the reflection surface emerges, and wherein the image side prism has a cut surface formed by cutting off a vertex portion between the reflection surface and the exit surface such that a whole normal light incident area within which normal light is incident on the reflection surface remains, and the cut surface is a non-diffusing surface.


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