The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2013

Filed:

May. 12, 2011
Applicants:

Jun Amako, Matsumoto, JP;

Kohei Yamada, Minowa, JP;

Inventors:

Jun Amako, Matsumoto, JP;

Kohei Yamada, Minowa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A spectrometry apparatus includes a transmissive diffraction grating that transmits incident light. The transmissive diffraction grating has inclined surfaces made of a first dielectric material. The inclined surfaces are arranged so that they are inclined relative to a reference line. When the angle of incidence of light incident on the transmissive diffraction grating is measured with respect to the reference line and defined as an angle α, and the angle of diffraction of diffracted light is measured with respect to the reference line and defined as an angle β, the angle of incidence α is smaller than a Bragg angle θ defined with respect to the inclined surfaces, and the angle of diffraction β is greater than the Bragg angle θ.


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