The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Jul. 28, 2011
Kevin F. Kelly, Houston, TX (US);
Richard G. Baraniuk, Houston, TX (US);
Leonore Mcmackin, Austin, TX (US);
Robert F. Bridge, Austin, TX (US);
Sujoy Chatterjee, Austin, TX (US);
Donna E. Hewitt, Austin, TX (US);
Tyler H. Weston, Austin, TX (US);
Kevin F. Kelly, Houston, TX (US);
Richard G. Baraniuk, Houston, TX (US);
Leonore McMackin, Austin, TX (US);
Robert F. Bridge, Austin, TX (US);
Sujoy Chatterjee, Austin, TX (US);
Donna E. Hewitt, Austin, TX (US);
Tyler H. Weston, Austin, TX (US);
InView Technology Corporation, Austin, TX (US);
Abstract
An imaging system and method that captures compressive sensing (CS) measurements of a received light stream, and also obtains samples of background light level (BGLL). The BGLL samples may be used to compensate the CS measurements for variations in the BGLL. The system includes: a light modulator to spatially modulate the received light stream with spatial patterns, and a lens to concentrate the modulated light stream onto a light detector. The samples of BGLL may be obtained in various ways: (a) injecting calibration patterns among the spatial patterns; (b) measuring complementary light reflected by digital micromirrors onto a secondary output path; (c) separating and measuring a portion of light from the optical input path; (d) low-pass filtering the CS measurements; and (e) employing a light power meter with its own separate input path. Also, the CS measurements may be high-pass filtered to attenuate background light variation.