The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8569699 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 29, 2013

Filed:

Jan. 25, 2011
Applicant:

Yasuhiko Murakami, Nagano, JP;

Inventor:

Yasuhiko Murakami, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for manufacturing a MEMS device having an undercut shape formed on a fixed part includes a first step of forming an etching layer having a first cavity on the fixed part; a second step of forming a mask layer on a side wall of the etching layer, the side wall facing the first cavity; and a third step of directing an etchant fed into the first cavity on a surface side of the mask layer to a back surface side of the mask layer, isotropically etching the etching layer, forming a second cavity communicated with the first cavity on the back surface side of the mask layer, and processing the etching layer into an undercut shape.


Find Patent Forward Citations

Murakami, Yasuhiko. (2013). Method for manufacturing mems device, method for manufacturing thermal detector, thermal detector, thermal detection device, and electronic instrument (U.S. Patent No. 8569699). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8569699

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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