The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2013

Filed:

Nov. 17, 2010
Applicants:

Wayne T. Holcombe, Mountain View, CA (US);

Miroslav Svajda, San Jose, CA (US);

Inventors:

Wayne T. Holcombe, Mountain View, CA (US);

Miroslav Svajda, San Jose, CA (US);

Assignee:

Silicon Laboratories Inc., Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06M 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system includes a plurality of photo detectors, which generate signals proportional to incident light. The system further includes an optical barrier adjacent to a surface and includes a control circuit. The optical barrier partially obstructs reflected light from reaching the plurality of photo detectors to produce a spatially dependent reflectance pattern that is dependent on a position of an object relative to a substrate. The control circuit determines a position of the object during a reflectance measurement cycle using each of the plurality of photo detectors by calibrating to ambient light conditions, measuring ambient plus reflected light, determining the reflected light and detecting the position of the object based on a ratio of the reflected light received by at least two of the plurality of photo detectors.


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