The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2013
Filed:
Sep. 02, 2011
Yijun Huang, Pleasantville, NY (US);
Tetsuyoshi Royama, Montvale, NJ (US);
Alexandre Kotchkin, Ridgewood, NJ (US);
Yijun Huang, Pleasantville, NY (US);
Tetsuyoshi Royama, Montvale, NJ (US);
Alexandre Kotchkin, Ridgewood, NJ (US);
Topcon Medical Systems, Inc., Oakland, NJ (US);
Abstract
Certain diseases of the retina are diagnosed by circular profile analysis of retinal parameters, such as thickness. Retinal thickness around a user-defined circle on the retina is measured by three-dimensional optical coherence tomography or other ophthalmological techniques. Abnormally thin regions are identified by comparing a measured function of thickness vs. polar angle to a reference function of thickness vs. polar angle. A degree of abnormality is characterized by the ratio of the integral of the measured thickness function to the integral of the reference thickness function over the abnormally thin region, as specified by a range of polar angles.