The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8567895 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 29, 2013

Filed:

Feb. 11, 2011
Applicants:

Koji Furukawa, Kanagawa-ken, JP;

Jun Isozaki, Ebina, JP;

Masaki Kataoka, Ebina, JP;

Inventors:

Koji Furukawa, Kanagawa-ken, JP;

Jun Isozaki, Ebina, JP;

Masaki Kataoka, Ebina, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 2/175 (2006.01);
U.S. Cl.
CPC ...
Abstract

An abnormality judgment apparatus of a liquid supply system which supplies liquid from a liquid tank to a liquid ejection head via a liquid flow channel, includes: a pressure change application device which applies a pressure change to the liquid flow channel; first and second pressure measurement devices which measure a pressure in the liquid flow channel; and an abnormality judgment device which performs abnormality judgment and identification of an abnormal location in the liquid supply system, according to measurement values measured by the first and second pressure measurement devices before and after the pressure change is applied by the pressure change application device.


Find Patent Forward Citations

Furukawa, Koji. (2013). Abnormality judgment apparatus and abnormality judgment method of liquid supply system (U.S. Patent No. 8567895). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8567895

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