The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Dec. 23, 2010
Peter Puhov, Shrewsbury, MA (US);
Shay Harel, Marlborough, MA (US);
Huzefa Hakimi, Shrewsbury, MA (US);
Lili Chen, Hopkinton, MA (US);
Zhiqi Liu, Hopkinton, MA (US);
Peter Puhov, Shrewsbury, MA (US);
Shay Harel, Marlborough, MA (US);
Huzefa Hakimi, Shrewsbury, MA (US);
Lili Chen, Hopkinton, MA (US);
Zhiqi Liu, Hopkinton, MA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
A method is used in analyzing drive errors in data storage systems. An error tag and total good I/O count are maintained for a drive. For each failed I/O, the following is performed. An error weight per error is retrieved. A new error tag is calculated from the error weight, a previous error tag, and the total good I/O count. An error ratio is calculated from the new error tag and a total I/O count. The error ratio is compared with thresholds. If one or more of the thresholds has been crossed, action is taken on the drive. The error tag is reduced as good I/O is produced.