The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Dec. 17, 2009
Xiangping Chen, Shrewsbury, MA (US);
Khang Can, Framingham, MA (US);
Manish Madhukar, Shrewsbury, MA (US);
David W. Harvey, Newton Center, MA (US);
Dean D. Throop, Efland, NC (US);
Mark K. Ku, Wollaston, MA (US);
Xiangping Chen, Shrewsbury, MA (US);
Khang Can, Framingham, MA (US);
Manish Madhukar, Shrewsbury, MA (US);
David W. Harvey, Newton Center, MA (US);
Dean D. Throop, Efland, NC (US);
Mark K. Ku, Wollaston, MA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
A method is used in measuring data access activity. I/O data is analyzed that describes I/O activity for a slice of a logical volume. Based on the I/O data, a first value of data access activity is determined for the slice corresponding to a first time period, and a second value of data access activity is determined corresponding to a second time period. From the first and second values, an exponential moving average of data access activity is derived for the slice.