The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Sep. 30, 2010
Applicants:

Shaohua Yang, Santa Clara, CA (US);

Bruce Mcneill, Yokohama, JP;

Weijun Tan, Longmont, CO (US);

Inventors:

Shaohua Yang, Santa Clara, CA (US);

Bruce McNeill, Yokohama, JP;

Weijun Tan, Longmont, CO (US);

Assignee:

LSI Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various embodiments of the present invention provide systems and methods for sync mark detection. As an example, a sync mark detection circuit is discussed that includes a storage circuit, a plurality of noise predictive filter circuits, and a controller circuit. The storage circuit is operable to store a data input as a stored input. The plurality of noise predictive filters are operable to receive a processing input. At least one of the noise predictive filters is selectably modifiable to either increase the probability of finding a sync mark in the processing input or to maintain a baseline probability of finding the sync mark in the processing input. The controller circuit is operable to determine an operational mode that may be a standard operational mode, a bit flipping mode, or a filter modification mode.


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