The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
May. 13, 2010
Kenji Tamaki, Kawasaki, JP;
Toshiharu Miwa, Yokohama, JP;
Kenji Tamaki, Kawasaki, JP;
Toshiharu Miwa, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention relates to an apparatus abnormality monitoring method, and it provides a technology that can achieve accurate abnormality detection, cause diagnosis, and others. This system relates to monitoring of a newly-installed apparatus (T) among a plurality of similar apparatuses. In a judgment model creation module, for each of a plurality of (K) already-installed similar apparatuses (a, b and others), individual judgment models (prediction models) are created, and a meta prediction model for predicting a coefficient and an intercept of these prediction models from feature item values and others of each of the apparatusesis created. From this meta prediction model, a prediction model dedicated to the apparatus (T) (judgment model including the prediction model) is produced. By using this judgment model, a judgment moduleT monitors the state of the apparatus (T) to perform abnormality detection.