The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Dec. 08, 2009
Rao H. Desineni, Essex Junction, VT (US);
Maroun Kassab, Essex Junction, VT (US);
Mary P. Kusko, Poughkeepsie, NY (US);
Leah M. Pastel, Essex Junction, VT (US);
Rao H. Desineni, Essex Junction, VT (US);
Maroun Kassab, Essex Junction, VT (US);
Mary P. Kusko, Poughkeepsie, NY (US);
Leah M. Pastel, Essex Junction, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of selecting fault candidates based on the physical layout of an Integrated Circuit (IC) layout, that includes, identifying failing observation points in an IC layout, determining the failing observation points proximity geometry in the IC circuit layout, determining if a proximity criteria for the failing observation points is met, and identifying faults associated with the failing observation points that meet the proximity criteria; and including the identified faults in a fault candidate set.