The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Mar. 23, 2009
Kenji Taira, Tokyo, JP;
Hiroyoshi Yajima, Kanagawa, JP;
Shinichi Takimoto, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An optical inspection device, comprising a light generation means, a light irradiation meansirradiating an object to be inspectedwith light generated from the light generation meansand a photodetection meansphotoelectrically converting signal light obtained from the object to be inspectedthrough irradiation of light by the light irradiation means, and inspecting the object to be inspectedbased on output from the photodetection means, wherein a light amplification meansamplifying signal light obtained from the object to be inspectedis provided. There is thus provided an optical inspection device capable of photoelectrically converting signal light from the object to be inspected with high sensitivity and promptly with its inexpensive configuration without increasing the intensity of light with which the object to be inspected is irradiated and without using an expensive low-noise and high-sensitivity photodetector.