The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
May. 22, 2009
Tatsuya Kinukawa, Mishima, JP;
Hitoshi Furukawa, Suntou-gun, JP;
Takao Kume, Yokohama, JP;
Kazuhiro Funatani, Mishima, JP;
Masahide Hirai, Numazu, JP;
Yoshiro Saito, Susono, JP;
Tomoaki Nakai, Numazu, JP;
Tatsuya Kinukawa, Mishima, JP;
Hitoshi Furukawa, Suntou-gun, JP;
Takao Kume, Yokohama, JP;
Kazuhiro Funatani, Mishima, JP;
Masahide Hirai, Numazu, JP;
Yoshiro Saito, Susono, JP;
Tomoaki Nakai, Numazu, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
There is provided an image forming apparatus which shortens the time taken for circumference detection and measures the circumference at high precision without obstructing downsizing of the apparatus. To accomplish this, the image forming apparatus detects, at an arbitrary timing, the physical pattern of the image-formed surface of a rotation member that changes over time. In the second round, the image forming apparatus detects the second pattern at a timing a predetermined time after the arbitrary timing. By using the detected patterns, the image forming apparatus obtains information associated with the circumference of the rotation member.