The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Jun. 03, 2011
Applicants:
Ole Eichhorn, Westlake Village, CA (US);
Cindy Perz, Vista, CA (US);
Inventors:
Ole Eichhorn, Westlake Village, CA (US);
Cindy Perz, Vista, CA (US);
Assignee:
Leica Biosystems Imaging, Inc., Vista, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G21K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system that determines the quality of a digital microscope slide by analyzing digital slide images based on complexity and spatial frequencies. An example embodiment detailed in the application may provide visual feedback on the whole slide quality by overlaying the image with a color coded 'heat map' of local area quality. A user provided with the overlap image may obtain both an absolute quality measurement for the whole image and quickly identity the quality variability within the slide.