The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Aug. 04, 2011
Applicants:
Yuanyuan Ding, Santa Clara, CA (US);
Jing Xiao, Cupertino, CA (US);
Inventors:
Yuanyuan Ding, Santa Clara, CA (US);
Jing Xiao, Cupertino, CA (US);
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods for object detection that consider background information are presented. Embodiments of the present invention utilizing a feature called Local Difference Pattern (LDP), which is more discriminative for modeling local background image features. In embodiments, the LDP feature is used to train detection models. In embodiments, the LDP feature may be used in detection to differentiate different image background conditions and adaptively adjust classification to yield higher detection rates.