The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Jun. 19, 2012
Applicant:

Heon Ho Chung, Laguna Niguel, CA (US);

Inventor:

Heon Ho Chung, Laguna Niguel, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of operating a disk drive comprises scanning each Logical Block Address (LBA) of the disk drive to detect a read error or reading the LBA from a media defect list. The LBA may then be converted to a corresponding physical location on the media and a scan of the corresponding physical location and of nearby physical locations that are within a proximity threshold of the corresponding physical locations may be performed to find media defects. Based thereon, it may then be determined whether a media scratch is present and at least one or more data sectors associated with the media scratch may be relocated to a spare location on the media if the media scratch is determined to be present. If the media scratch is determined not to be present, only the data sector associated with the corresponding physical location may be relocated to the spare location.


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