The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Mar. 09, 2011
Applicant:
Manfred Kuster, Widnau, CH;
Inventor:
Manfred Kuster, Widnau, CH;
Assignee:
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 9/00 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0075 (2013.01); G02B 21/00 (2013.01);
Abstract
The present invention relates to an afocal zoom system for a microscope with a shutter for controlling the depth of focus of the microscopic image produced by an object, wherein at least one shutter is disposed in front of the first lens group of the zoom system, viewed from the object, in the direction of the beam path passing through the zoom system, and/or at least one shutter is disposed on a lens group of the zoom system, the diameter of which can be varied in order to control the depth of focus, without causing vignetting of the edge beams.