The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Oct. 25, 2011
Applicant:

Ron Beselt, Burnaby, CA;

Inventor:

Ron Beselt, Burnaby, CA;

Assignee:

Honeywell ASCa Inc., Mississauga, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Upper to lower assembly analog position sensors in a dual scanning system measure alignment offsets. A controller uses error signals from the position sensors to calculate actuator error profiles that are used in the next scan in the same direction, with different error profiles being used for forward and reverse scans. Since the alignment error profiles are repeatable for a given set of scanner conditions, the actuator controller anticipates what the error signal will be before each scanning assembly reaches a given position. An optimized error correction can be calculated based on the error profiles and actuator bandwidth without concerns regarding feedback loop speed, overshoot, and unstable control oscillations. An actuation system driven from error profiles can correct for alignment offsets by actively changing belt tensions at the offsetting drive pulleys and/or changing the position of sensor assemblies relative to the drive belt systems.


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