The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Jul. 26, 2011
Applicants:

Zhijia Yuan, River Edge, NJ (US);

Zhenguo Wang, Fort Lee, NJ (US);

Kinpui Chan, Ridgewood, NJ (US);

Inventors:

Zhijia Yuan, River Edge, NJ (US);

Zhenguo Wang, Fort Lee, NJ (US);

Kinpui Chan, Ridgewood, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical imaging method is provided that can realize, at low cost, the extension of the imaging depth range. An optical imaging apparatusis an apparatus that forms a tomographic image of an object using FD-OCT, and performs a scanning step, detection step and imaging step. In the scanning step, the object is scanned with a signal light while alternately changing the phase difference between the signal light and a reference light to two preset phase differences. In the detection step, interference light of the signal light passing through the object and the reference light is detected. In the imaging step, a tomographic image of the object is formed based on the detection results of a plurality of the interference lights sequentially obtained in the detection step according to the scanning.


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