The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Aug. 25, 2010
Applicants:

Hibiki Tatsuno, Kanagawa, JP;

Nobuyuki Arai, Kanagawa, JP;

Inventors:

Hibiki Tatsuno, Kanagawa, JP;

Nobuyuki Arai, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 15/14 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanner includes a light source including light emitters, an aperture member collimating light beams from the light source, a deflector deflecting the light beams passing through the aperture member, and a scanning optical system condensing the deflected light beams onto a scanned surface to optically scan the surface in a main-scanning direction. The scanning optical system includes a resin scanning system having at least one resin scanning lens. At least one folding mirror/sheet glass is disposed between a scanning lens nearest to the deflector in the resin scanning system and the scanned surface. At least one scanning lens in the resin scanning system has an uneven birefringence distribution with respect to a sub-scanning direction. An optical conjugate image of the aperture member is formed between a lens surface nearest to the deflector in the resin scanning system and a lens surface nearest to the scanned surface with respect to the sub-scanning direction.


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