The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Sep. 23, 2011
Applicant:
Gary Carreau, Plaistow, NH (US);
Inventor:
Gary Carreau, Plaistow, NH (US);
Assignee:
Analog Devices, Inc., Norwood, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Techniques to reduce correlated errors in a multi-channel sampling system. A plurality of clock signals may be generated from a master clock signal, each with edges offset from each other. The offset clock signals may be distributed to a plurality of sampling devices. Each sampling device may capture a respective input signal according to its offset clock. In this manner, the sampling units may sample their inputs signals over a distributed window of time rather than sampling in response to a common clock edge. By distributing the switching operations performed by the sampling units, noise effects are likely to be reduced.