The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Mar. 13, 2012
Toshimi Yokota, Hitachiohta, JP;
Kenji Araki, Mito, JP;
Kenji Utaka, Hitachi, JP;
Noritaka Matsumoto, Hitachi, JP;
Masatoshi Takada, Hitachi, JP;
Ryosuke Shigemi, Hitachi, JP;
Chikara Ota, Souma, JP;
Toshimi Yokota, Hitachiohta, JP;
Kenji Araki, Mito, JP;
Kenji Utaka, Hitachi, JP;
Noritaka Matsumoto, Hitachi, JP;
Masatoshi Takada, Hitachi, JP;
Ryosuke Shigemi, Hitachi, JP;
Chikara Ota, Souma, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
When an RFID is attached to an object to assist testing operations, the following problems are encountered; (1) the RFID of write type tends to cause a failure and is troublesome due to the necessity of rewrite each time the situation is changed, (2) the incorporation of the reader function in a terminal block increases the cost, and (3) the known techniques are targeted for only the connecting operation and are not adapted for a sequence test that takes the most expense in time and effort. The operations are aided by using an RFID reader and a terminal having the function for accessing a database of circuit information, RFID information, and test procedure information.