The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Jan. 27, 2010
Isaac Wen-yih Tseng, Taipei, TW;
Fang-cheng Yeh, Taipei, TW;
Isaac Wen-Yih Tseng, Taipei, TW;
Fang-Cheng Yeh, Taipei, TW;
Other;
Abstract
A method is adapted for providing microstructural information of a biological target from a plurality of diffusion weighted MR images corresponding to a specific area of the biological target. Each of the diffusion weighted MR images is obtained using a respective q-space sampling vector and is sampled at a plurality of sample points thereof to obtain a group of diffusion weighted MR image data. The diffusion weighted MR image data are processed to obtain a spin distribution function from which the microstructural information of the biological target can be obtained.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile