The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Nov. 11, 2009
Applicants:

Shoji Akiyama, Annaka, JP;

Atsuo Ito, Tokyo, JP;

Inventors:

Shoji Akiyama, Annaka, JP;

Atsuo Ito, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/30 (2006.01); H01L 21/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a method for manufacturing an SOI substrate capable of effectively and efficiently embrittling an interface of an ion-implanted layer without causing the separation of a bonded surfaceor the breakage of a bonded wafer. Provided is a method for manufacturing an SOI substrateby forming an SOI layeron a surface of a transparent insulating substrate, the method comprising, in the following order, implanting ions into a silicon waferor a silicon waferwith an oxide filmfrom a surface thereof so as to form an ion-implanted layer; subjecting at least one of the surface of the transparent insulating substrate and the surface of the ion-implanted silicon wafer or the silicon wafer with an oxide film to a surface activation treatment; bonding together the silicon waferor the silicon waferwith an oxide filmand the transparent insulating substrate; subjecting the bonded wafer to a heat treatment at 150° C. or higher but not higher than 350° C. so as to obtain a laminate; and irradiating visible light at a side of the transparent insulating substrateof the laminatetoward the ion-implanted layerof the silicon waferor the silicon waferwith an oxide filmto embrittle an interface of the ion-implanted layerand transfer a silicon thin film to the transparent insulating substrateso that the SOI layercan be formed.


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