The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Jul. 09, 2010
Yuk Ming Dennis Lo, Kowloon, HK;
Rossa Wai Kwun Chiu, Shatin, HK;
Yu Kwan Tong, Tuen Mun, HK;
Shengnan Jin, Singapore, SG;
Siu Chung Stephen Chim, Quarry Bay, HK;
Wai Yi Tsui, Tsuen Wan, HK;
Yuk Ming Dennis Lo, Kowloon, HK;
Rossa Wai Kwun Chiu, Shatin, HK;
Yu Kwan Tong, Tuen Mun, HK;
Shengnan Jin, Singapore, SG;
Siu Chung Stephen Chim, Quarry Bay, HK;
Wai Yi Tsui, Tsuen Wan, HK;
The Chinese University of Hong Kong, Shatin, N.T., Hong Kong, CN;
Abstract
The present invention relates to a new, non-invasive method for detecting chromosomal aneuploidy by analyzing a sample from a pregnant woman. The detection is based on the ratio between the amount of a fetal methylation marker located on a chromosome relevant to the aneuploidy and the amount of a fetal genetic marker located on a reference chromosome, offering improved accuracy.