The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8562134 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 22, 2013

Filed:

Dec. 17, 2010
Applicant:

Osamu Wada, Ina, JP;

Inventor:

Osamu Wada, Ina, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/02 (2006.01); G02C 5/00 (2006.01); G06K 9/20 (2006.01); G01B 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A vision shift amount measuring method includes: forming a reference mark indicating a distance eye point on a surface of a spectacle lens attached to a spectacle frame practically worn by a wearer, and forming a plurality of opaque lines in an area expected to contain a shifted vision on the surface of the spectacle lens with a predetermined space between the adjoining lines; and allowing the wearer wearing the spectacle frame to select the line closest to a position through which the vision passes from the plural formed lines.


Find Patent Forward Citations

Wada, Osamu. (2013). Vision shift amount measuring method and vision shift amount measuring jig (U.S. Patent No. 8562134). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8562134

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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