The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Oct. 30, 2009
Applicants:

Dong-sheng Lin, Taipei Hsien, TW;

Tzyy-chyi Tsai, Taipei Hsien, TW;

Jian-jun LI, Shenzhen, CN;

Inventors:

Dong-Sheng Lin, Taipei Hsien, TW;

Tzyy-Chyi Tsai, Taipei Hsien, TW;

Jian-Jun Li, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement apparatus includes a support frame to support a feed mechanism, an orientation mechanism, a measurement mechanism, a transfer mechanism, and an unloading mechanism. The feed mechanism includes a first holding assembly, a first elevation assembly, a second elevation assembly, and a first clipping assembly. The first elevation assembly and the second elevation assembly are positioned under the holding assembly, and the first clipping assembly is positioned over the holding assembly. The measurement mechanism includes a support stage and at least one calibration head. The transfer mechanism includes at least one pickup head. The orientation mechanism includes a driving member and a securing assembly driven by the driving member. The unloading mechanism has the same structure as the feed mechanism. The disclosure further provides a measuring method using the measurement apparatus.


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