The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Mar. 27, 2012
Applicants:

Naofumi Mirumachi, Saitama, JP;

Masao Mori, Saitama, JP;

Masataka Takahashi, Matsudo, JP;

Inventors:

Naofumi Mirumachi, Saitama, JP;

Masao Mori, Saitama, JP;

Masataka Takahashi, Matsudo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07D 5/00 (2006.01); G07D 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging unit images a subject having an unevenness pattern on a surface. The imaging unit includes: a surface light source that emits with a constant output illumination light illuminating the surface of the subject; an imager that receives reflected light reflected by the surface of the subject; and a beam splitter that is arranged at a location at which the illumination light emitted from the surface light source and the reflected light incident on the imager intersect with each other. The illumination light emitted from the surface light source is incident on the surface of the subject via the beam splitter. The reflected light reflected by the surface of the subject is incident on the imager via the beam splitter. The illumination light incident on the surface of the subject includes parallel light that is perpendicularly incident on the surface of the subject, and diffused light.


Find Patent Forward Citations

Loading…