The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Apr. 24, 2012
Bhavna Agrawal, Armonk, NY (US);
David S. Kung, Chappaqua, NY (US);
Jinjun Xiong, White Plains, NY (US);
Vladimir Zolotov, Putnam Valley, NY (US);
Bhavna Agrawal, Armonk, NY (US);
David S. Kung, Chappaqua, NY (US);
Jinjun Xiong, White Plains, NY (US);
Vladimir Zolotov, Putnam Valley, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
In one embodiment, the invention is a method and apparatus for variation enabling statistical testing using deterministic multi-corner timing analysis. One embodiment of a method for obtaining statistical timing data for an integrated circuit chip includes obtaining deterministic multi-corner timing data for the integrated circuit chip and constructing the statistical timing data from the deterministic multi-corner timing data.