The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2013

Filed:

May. 30, 2002
Applicants:

Richard Petrus Kleihorst, Eindhoven, NL;

Adrianus Johannes Maria Denissen, Eindhoven, NL;

Andre Krijn Nieuwland, Eindhoven, NL;

Nico Frits Benschop, Eindhoven, NL;

Inventors:

Richard Petrus Kleihorst, Eindhoven, NL;

Adrianus Johannes Maria Denissen, Eindhoven, NL;

Andre Krijn Nieuwland, Eindhoven, NL;

Nico Frits Benschop, Eindhoven, NL;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The subject matter hereof relates to error detection. Various example embodiments for error defection are disclosed. In an example method of error detection in a Module UnderTest (MUT), a parity signal representing the parity of an MUT output is compared to a parity signal representing the parity of an errorless MUT output. In an example system, an Actual Parity Generator provides a parity signal representing the parity of on MUT output, a State Parity Generator provides a parity signal representing the parity of an errorless MUT output, and a comparator compares these two parity signals.


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