The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Aug. 31, 2010
Zhiyuan Wang, Fremont, CA (US);
Xinli Gu, Sunnyvale, CA (US);
Zhanglei Wang, Fremont, CA (US);
Hongxia Fang, Durham, NC (US);
Zhiyuan Wang, Fremont, CA (US);
Xinli Gu, Sunnyvale, CA (US);
Zhanglei Wang, Fremont, CA (US);
Hongxia Fang, Durham, NC (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
An example method is provided and includes executing a functional test for an integrated circuit and observing a failure associated with the integrated circuit. The method also includes executing a functional scan mode in order to reproduce the failure associated with the integrated circuit. A functional state of the integrated circuit is locked when the failure occurs, and the functional state is subsequently recovered for a structure test for the integrated circuit. In more particular embodiments, particular states of the functional test are evaluated and compared against other states associated with a model circuit that did not experience any failure in order to identify a latest cycle of the integrated circuit that could trigger the failure and an earliest cycle of the integrated circuit that could observe the failure.