The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2013

Filed:

Sep. 23, 2010
Applicants:

James A. Bailey, Snowflake, AZ (US);

Robert K. Chen, North Andover, MA (US);

Richard T. Kaul, Hudson, WI (US);

Inventors:

James A. Bailey, Snowflake, AZ (US);

Robert K. Chen, North Andover, MA (US);

Richard T. Kaul, Hudson, WI (US);

Assignee:

LSI Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various embodiments of the present invention provide systems and methods for data filter tuning. As an example, a method for filter tuning is disclosed that includes: providing a tunable filter having an operation filter and a calibration filter; applying a low frequency test input to the operation filter in place of an input signal to yield a first filter output; calculating a low frequency magnitude value corresponding to the first filter output; applying a high frequency test input to the operation filter in place of an input signal to yield a second filter output; calculating a high frequency magnitude value corresponding to the second filter output; modifying a tuning factor of the calibration filter when a ratio of the high frequency magnitude value and the low frequency magnitude value is outside of a defined range; and storing the tuning factor of the calibration filter when the ratio of the high frequency magnitude value and the low frequency magnitude value is within the defined range.


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