The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Aug. 27, 2008
Nagaraj Hunur, Hyderabad, IN;
Martin Hoyes, San Francisco, CA (US);
Peter Murphy, West Greenwich, RI (US);
Prasad Bodla, Foster City, CA (US);
Nagaraj Hunur, Hyderabad, IN;
Martin Hoyes, San Francisco, CA (US);
Peter Murphy, West Greenwich, RI (US);
Prasad Bodla, Foster City, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A reasonably-sized testing database instance can be efficiently replicated and maintained for a very large production database while retaining the characteristics and cross-sectional data. The performance characteristics are maintained in order to provide for proper testing of the production database for various application programs. Statistics on the type of data distribution for the customer data are obtained, allowing for parameters to be determined which can be used to store data only near the endpoints of the distribution (and/or at other key locations). In this way, a substantial amount of data skew is retained in a much smaller instance of the production database, allowing for easier performance testing, upgrade testing, etc.