The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Feb. 10, 2011
Kevin Lerman, New York, NY (US);
Vinicius J. Fortuna, New York, NY (US);
Andrew W. Hogue, Ho-Ho-Kus, NJ (US);
John R. Provine, New York, NY (US);
Engin Cinar Sahin, New York, NY (US);
John J. Lee, Brooklyn, NY (US);
Kevin Lerman, New York, NY (US);
Vinicius J. Fortuna, New York, NY (US);
Andrew W. Hogue, Ho-Ho-Kus, NJ (US);
John R. Provine, New York, NY (US);
Engin Cinar Sahin, New York, NY (US);
John J. Lee, Brooklyn, NY (US);
Google Inc., Mountain View, CA (US);
Abstract
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for machine learning. In one aspect, a method includes receiving a collection of facts, each fact represented as an entity-attribute-value tuple; identifying expected values for one or more individual attributes, where the identifying expected values includes, for each particular attribute: identifying facts having the attribute, calculating a value score for facts of the collection of facts having the particular attribute for each particular value, calculating a global score for all facts of the collection having the attribute, and comparing the value score to the global score such that a value is identified as an expected value if the comparison satisfies a specified threshold.