The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8560379 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 15, 2013

Filed:

Aug. 07, 2003
Applicants:

Ira R. Forman, Austin, TX (US);

Charles Gorham Ward, Austin, TX (US);

Inventors:

Ira R. Forman, Austin, TX (US);

Charles Gorham Ward, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
Abstract

An implementation for estimating the costs attributable to software failures brought on by defects, i.e. estimating that portion of the cost of owning software products that is attributable to potential damage to the software owner resulting from potential defects in the software provided by particular software suppliers. Calculating the cost of ownership of a software product obtained from a proposed supplier, including a cost of software failure factor that is estimated as follows: predetermining the quality level of an ideal supplier of the software product and then determining the deviation in quality level of the proposed software supplier from the ideal supplier level. Then, estimating the difference in product defect rate at the quality level of the proposed supplier from the defect rate of the ideal supplier, after which the cost to compensate for the damage resulting from each defect based upon the intended use of the software product is estimated. Finally, a cost of software failure factor for each unit of the software product obtained from the proposed supplier is calculated by multiplying said difference in defect rate by the cost to compensate for damage resulting from each defect.


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