The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2013

Filed:

Jun. 13, 2011
Applicant:

Xiang Cao, Shenzhen, CN;

Inventor:

Xiang Cao, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A method for testing electronic devices that are correspondingly connected to test units includes generating control signals for the electronic devices that are connected to one or more test units selected from the test units. A control unit adds ID codes corresponding to the selected test units to the control signals, and wirelessly transmits the control signals with the ID codes to all of the test units. Each of the test units compares the ID codes added to the control signals with its own stored ID code. When the ID code added to a control signal is in accordance with the ID code stored in one of the test units, the test unit controls the electronic device connected thereto to be turned on and off according to the control signal.


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