The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Jan. 17, 2012
Mutasim A. Salman, Rochester Hills, MI (US);
Yilu Zhang, Northville, MI (US);
Mark N. Howell, Rochester Hills, MI (US);
Xidong Tang, Royal Oak, MI (US);
Youseff A. Ghoneim, Rochester, MI (US);
Walter A. Dorfstatter, Northville, MI (US);
Mutasim A. Salman, Rochester Hills, MI (US);
Yilu Zhang, Northville, MI (US);
Mark N. Howell, Rochester Hills, MI (US);
Xidong Tang, Royal Oak, MI (US);
Youseff A. Ghoneim, Rochester, MI (US);
Walter A. Dorfstatter, Northville, MI (US);
GM Global Technology Operations LLC, Detroit, MI (US);
Abstract
A cooperative diagnostic and prognosis system for generating a prognosis of at least one component in a vehicle. An in-vehicle diagnostic unit determines a diagnostic signature of the component each time an occurrence of a condition is triggered and transmits the diagnostic signature to an off-board diagnostic unit. The off-vehicle diagnostic unit determines a SOH of the component and a rate-of-change in the SOH of the component. The off-vehicle diagnostic unit determines whether the rate-of-change in the SOH is greater than a threshold. The off-vehicle diagnostic unit requests additional information from the vehicle in response to the rate-of-change in the SOH being greater than the threshold. The additional information relating to operating parameter data associated with the component. The off-vehicle diagnostic unit receives the requested information and predicts a time-to-failure of the component.