The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2013

Filed:

May. 24, 2010
Applicants:

Qingsheng Quinn Zheng, Sugar Land, TX (US);

Hong Zhao, Sugar Land, TX (US);

Inventors:

Qingsheng Quinn Zheng, Sugar Land, TX (US);

Hong Zhao, Sugar Land, TX (US);

Assignee:

Aspen Technology, Inc., Burlington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

Apparatuses and methods for model quality estimation and model adaptation in multivariable process control are disclosed. A method for updating a multiple input multiple output (MIMO) dynamical model of a process includes perturbing the process, auditing the controller model, identifying poor performing submodels and re-testing the relevant process variables, re-identifying submodels and adapting the model online while the process continues to operate within normal operating parameters. An apparatus comprises an online multivariable controller, a tester, a database to store data corresponding to manipulated variables and controlled variables, and a performance diagnosis module configured to identify problematic submodels and adapt a model used by the controller.


Find Patent Forward Citations

Zheng, Qingsheng. (2013). Apparatus and method for model quality estimation and model adaptation in multivariable process control (U.S. Patent No. 8560092). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8560092

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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