The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2013

Filed:

Sep. 15, 2010
Applicants:

Florin Cutzu, San Jose, CA (US);

Sumit Chawla, San Carlos, CA (US);

Ted Cooper, Sunnyvale, CA (US);

Robert A. Williams, Los Altos, CA (US);

Inventors:

Florin Cutzu, San Jose, CA (US);

Sumit Chawla, San Carlos, CA (US);

Ted Cooper, Sunnyvale, CA (US);

Robert A. Williams, Los Altos, CA (US);

Assignee:

Foveon, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/56 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for identifying singleton outlier pixels in a selected color space in a digital image including a plurality of pixels, includes for each 3×3 patch of pixels in the image, calculating the diameter of the 3×3 patch of pixels. For each pixel in the patch, the distance to its nearest neighbor pixel within the patch is computed, as measured in the selected color space. The computed distance from each pixel in the patch is compared to its nearest neighbor with a threshold that is a preselected fraction of the diameter. A center pixel in the patch is identified as an outlier pixel if its calculated distance to its nearest neighbor is the largest distance to a nearest neighbor and exceeds the threshold.


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