The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2013

Filed:

Mar. 14, 2011
Applicants:

Andrey V. Kanaev, Lorton, VA (US);

Jeremy Murray-krezan, Albuquerque, NM (US);

Inventors:

Andrey V. Kanaev, Lorton, VA (US);

Jeremy Murray-Krezan, Albuquerque, NM (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A spectral anomaly detection method includes the steps of segmenting a panchromatic image, obtained from a hyperspectral sensor into cluster data sets. Principal component analysis can be separately performed on each of the cluster data sets to produce a plot of principal components. An anomaly detection algorithm can be applied to an adaptively selected subset of principal components for each of the cluster data sets to produce cluster detection scores. Finally, separate detection thresholding algorithms can be applied to each of the cluster detection scores, and the results of the detection thresholding algorithms can be combined into a single detection plane.


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