The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Oct. 30, 2009
Be-shan Chiang, Buffalo Grove, IL (US);
Alex Zamyatin, Buffalo Grove, IL (US);
Mike Silver, Northbrook, IL (US);
Yu Zou, Naperville, IL (US);
Naruomi Akino, Tochigi-ken, JP;
Thomas Labno, Algonquin, IL (US);
Be-Shan Chiang, Buffalo Grove, IL (US);
Alex Zamyatin, Buffalo Grove, IL (US);
Mike Silver, Northbrook, IL (US);
Yu Zou, Naperville, IL (US);
Naruomi Akino, Tochigi-ken, JP;
Thomas Labno, Algonquin, IL (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
A method of computed-tomography and a computed-tomography apparatus where the portion of the field of view of a subject were full scan data is available is reconstructed using a full-scan algorithm. In the areas where full scan data is not available, half-scanning is used. Data is also extrapolated from the full scan data. The extrapolated data overlaps a portion of the half-scanning data. The extrapolated data and the overlapped portion of the half-scanning data are feathered. The image is reconstructed using the full-scan, half-scan and feathered data. Corner regions in an image are exposed and reconstructed to produce more uniform z-coverage of the reconstruction field of view.