The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2013
Filed:
Aug. 08, 2008
Pascal Chevalier, Courbevoie, FR;
François Delaveau, Le Perreux sur Marne, FR;
François Pipon, Paris, FR;
Pascal Chevalier, Courbevoie, FR;
François Delaveau, Le Perreux sur Marne, FR;
François Pipon, Paris, FR;
Thales, Neuilly-sur-Seine, FR;
Abstract
A method for measuring certain parameters of the impulse response of a propagation channel involving emitters and reflectors that are fixed or mobile, and for detecting and determining the parameters regarding the position and kinematics of the emitters and reflectors, or for auto-locating the reception system implementing the invention, in a system comprising N sensors receiving signals from the emitters or from the reflection on the reflectors. The method determines an ambiguity function which couples the spatial analysis and the delay-distance/Doppler-kinematic analysis, and determines at least one sufficient statistic Ĉ(l,m,K) corresponding to the correlation between the known signal s(kTe) corresponding to the complex envelope of the signal emitted and the output of a filter w(l,m) where l corresponds to a temporal assumption and m corresponds to a frequency assumption. The method also determines the values of the pair (l,m) by comparing the value of the statistic for the pair (l,m) with a threshold value.